These two graphs display data from a study of dislocation densities on disk-shaped semiconductor wafers. The first graph is a histogram generated from data stored in multiple worksheets. The second graph is a scatter plot of the location of a measured value on the wafer.
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This ternary diagram displays the packing fraction when three particle types are combined. Each line in the graph represents a constant value for the packing fraction as a function of the fractional contribution of the three particles (course, fine, and medium) in the mixture.
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